{"created":"2023-06-19T09:35:56.015632+00:00","id":372,"links":{},"metadata":{"_buckets":{"deposit":"98bf465d-5f9e-4f84-a87e-ba320f6b2241"},"_deposit":{"created_by":16,"id":"372","owners":[16],"pid":{"revision_id":0,"type":"depid","value":"372"},"status":"published"},"_oai":{"id":"oai:mue.repo.nii.ac.jp:00000372","sets":["1:26:30"]},"author_link":["1104","1359"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-03-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"18","bibliographicPageEnd":"17","bibliographicPageStart":"13","bibliographic_titles":[{"bibliographic_title":"宮城教育大学情報処理センター研究紀要 : COMMUE"},{"bibliographic_title":"COMMUE","bibliographic_titleLang":"en"}]}]},"item_10002_description_12":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_description":"40018869298","subitem_description_type":"Other"}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"本研究室では、超伝導薄膜の作製を行っている。作製された超伝導薄膜の結晶構造は、4軸X線回折装置により評価された。X線回折測定の結果は、付属のソフトウェアにより表示可能であるが、3次元(3D)的に表示させることが出来ないため、視覚的に分かりにくいという問題があった。そこで我々は、LabVIEWを用いて、X線回折測定結果を3D表示させるプログラムを作成した。LabVIEWは、世界中の理工系分野で用いられている計測・制御用ソフトウェアであり、視覚的にプログラムを構築することが出来るため、短期間で実用的なソフトウェアの開発が可能である。本論文では、X線回折測定結果を視覚的に分かりやすく3D表示させるプログラム以外に2D表示で結晶構造を解析するプログラムも作成したので、合わせて報告する。","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宮城教育大学情報処理センター"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12544985","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1884-7773","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"大竹, 佑樹"}],"nameIdentifiers":[{"nameIdentifier":"1359","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"9000018454048","nameIdentifierScheme":"CiNii ID","nameIdentifierURI":"http://ci.nii.ac.jp/nrid/9000018454048"}]},{"creatorNames":[{"creatorName":"内山, 哲治"}],"nameIdentifiers":[{"nameIdentifier":"1104","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"9000006124403","nameIdentifierScheme":"CiNii ID","nameIdentifierURI":"http://ci.nii.ac.jp/nrid/9000006124403"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2014-07-10"}],"displaytype":"detail","filename":"comme_18_13-17.pdf","filesize":[{"value":"888.9 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"4軸X 線回折測定による超伝導薄膜配向性の3D表示プログラムの作成","url":"https://mue.repo.nii.ac.jp/record/372/files/comme_18_13-17.pdf"},"version_id":"f5b37bbd-7b50-4030-9846-9654800e5012"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"超伝導薄膜","subitem_subject_scheme":"Other"},{"subitem_subject":"X線回折","subitem_subject_scheme":"Other"},{"subitem_subject":"極図形","subitem_subject_scheme":"Other"},{"subitem_subject":"面内配向角","subitem_subject_scheme":"Other"},{"subitem_subject":"LabVIEW","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"4軸X線回折測定による超伝導薄膜配向性の3D表示プログラムの作成","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"4軸X線回折測定による超伝導薄膜配向性の3D表示プログラムの作成"}]},"item_type_id":"10002","owner":"16","path":["30"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-07-10"},"publish_date":"2014-07-10","publish_status":"0","recid":"372","relation_version_is_last":true,"title":["4軸X線回折測定による超伝導薄膜配向性の3D表示プログラムの作成"],"weko_creator_id":"16","weko_shared_id":-1},"updated":"2023-12-19T06:48:43.171946+00:00"}